<?xml version="1.0" encoding="utf-8"?><mads xmlns="http://www.loc.gov/mads/" xmlns:mods="http://www.loc.gov/mods/v3" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.loc.gov/mads/
	mads.xsd"><authority><topic authority="http://digilab.ptb.de/vocab/">metrology</topic></authority><related type="other"><topic>legal metrology</topic></related><related type="other"><topic>law on metrology</topic></related><related type="other"><topic>metrological supervision</topic></related><related type="broader"><topic>basic terms</topic></related> <note xml:lang="en">&lt;div class=&quot;ui-collapsible-content ui-body-inherit&quot; aria-hidden=&quot;false&quot;&gt;
&lt;p class=&quot;NoteEx&quot;&gt;Note Metrology includes all theoretical and practical aspects of measurement, whatever the measurement uncertainty and field of application.&lt;/p&gt;
&lt;p class=&quot;Reference&quot;&gt;[OIML V2-200:2012, 2.2]&lt;/p&gt;
&lt;/div&gt; </note></mads>