<?xml version="1.0" encoding="utf-8"?><mads xmlns="http://www.loc.gov/mads/" xmlns:mods="http://www.loc.gov/mods/v3" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.loc.gov/mads/
	mads.xsd"><authority><topic authority="http://digilab.ptb.de/vocab/">fault</topic></authority><related type="other"><topic>intrinsic error</topic></related><related type="other"><topic>error of indication</topic></related><related type="other"><topic>measuring instrument</topic></related><related type="other"><topic>fault limit</topic></related><related type="other"><topic>significant fault</topic></related><related type="other"><topic>influence factor</topic></related><related type="broader"><topic>Construction and operation of measuring instruments</topic></related> <note xml:lang="en">&lt;div class=&quot;ui-collapsible-content ui-body-inherit&quot; aria-hidden=&quot;false&quot;&gt;
&lt;p class=&quot;NoteEx&quot;&gt;Note 1 Principally, a fault is the result of an undesired change of data contained in or flowing through an electronic &lt;span class=&quot;AnchorInNote&quot;&gt;measuring instrument&lt;/span&gt;.&lt;/p&gt;
&lt;p class=&quot;NoteEx&quot;&gt;Note 2 From the definition it follows that a “fault” is a numerical value which is expressed either in a unit of measurement or as a relative value, for instance as a percentage.&lt;/p&gt;
&lt;/div&gt; </note></mads>