<?xml version="1.0" encoding="utf-8"?><mads xmlns="http://www.loc.gov/mads/" xmlns:mods="http://www.loc.gov/mods/v3" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.loc.gov/mads/
	mads.xsd"><authority><topic authority="http://digilab.ptb.de/vocab/">measuring instrument</topic></authority><related type="other"><topic>significant fault</topic></related><related type="other"><topic>type approval with limited effect</topic></related><related type="other"><topic>durability</topic></related><related type="other"><topic>preliminary examination</topic></related><related type="other"><topic>influence factor</topic></related><related type="other"><topic>verification by sampling</topic></related><related type="other"><topic>disturbance</topic></related><related type="other"><topic>initial verification</topic></related><related type="other"><topic>software separation</topic></related><related type="other"><topic>subsequent verification</topic></related><related type="other"><topic>software protection</topic></related><related type="other"><topic>mandatory periodic verification</topic></related><related type="other"><topic>event</topic></related><related type="other"><topic>rejection of a measuring instrument</topic></related><related type="other"><topic>user interface</topic></related><related type="other"><topic>requalification of a measuring instrument</topic></related><related type="other"><topic>inspection by sampling</topic></related><related type="other"><topic>sealing</topic></related><related type="other"><topic>obliteration of a verification mark</topic></related><related type="other"><topic>initial verification of measuring instruments utilizing the manufacturer&apos;s quality management system</topic></related><related type="other"><topic>placing on the market</topic></related><related type="other"><topic>rejection notice</topic></related><related type="other"><topic>verification mark</topic></related><related type="other"><topic>rejection mark</topic></related><related type="other"><topic>sealing mark</topic></related><related type="other"><topic>type approval mark</topic></related><related type="other"><topic>family of measuring instruments</topic></related><related type="other"><topic>indication</topic></related><related type="other"><topic>module</topic></related><related type="other"><topic>maximum permissible measurement error</topic></related><related type="other"><topic>type of a measuring instrument or module</topic></related><related type="other"><topic>rated operating condition</topic></related><related type="other"><topic>legally controlled measuring instrument</topic></related><related type="other"><topic>reference operating condition</topic></related><related type="other"><topic>legally relevant</topic></related><related type="other"><topic>specimen of an approved type</topic></related><related type="other"><topic>measuring system</topic></related><related type="other"><topic>legally relevant parameter</topic></related><related type="other"><topic>scale of a displaying measuring instrument</topic></related><related type="other"><topic>measuring instrument acceptable for verification</topic></related><related type="other"><topic>legal metrology</topic></related><related type="other"><topic>EUT</topic></related><related type="other"><topic>law on metrology</topic></related><related type="other"><topic>indicating device</topic></related><related type="other"><topic>legal metrological control</topic></related><related type="other"><topic>checking facility</topic></related><related type="other"><topic>legal control of measuring instruments</topic></related><related type="other"><topic>associated measuring instrument</topic></related><related type="other"><topic>type (pattern) evaluation</topic></related><related type="other"><topic>initial intrinsic error</topic></related><related type="other"><topic>fault</topic></related><related type="other"><topic>type approval</topic></related><related type="broader"><topic>basic terms</topic></related> <note xml:lang="en">&lt;p class=&quot;NoteEx&quot;&gt;Note 1 A measuring instrument that can be used alone is a &lt;span class=&quot;AnchorInNote&quot;&gt;measuring system&lt;/span&gt;.&lt;/p&gt;
&lt;p class=&quot;NoteEx&quot;&gt;Note 2 A measuring instrument may be an indicating measuring instrument or a material measure.&lt;/p&gt;
&lt;p class=&quot;NoteEx&quot;&gt;[OIML V2-200:2012, 3.1]&lt;/p&gt; </note></mads>