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	mads.xsd"><authority><topic authority="http://digilab.ptb.de/vocab/">Construction and operation of measuring instruments</topic></authority><related type="narrower"><topic>ancillary device</topic></related><related type="narrower"><topic>associated measuring instrument</topic></related><related type="narrower"><topic>checking facility</topic></related><related type="narrower"><topic>control instrument</topic></related><related type="narrower"><topic>disturbance</topic></related><related type="narrower"><topic>durability</topic></related><related type="narrower"><topic>durability error</topic></related><related type="narrower"><topic>durability test</topic></related><related type="narrower"><topic>fault</topic></related><related type="narrower"><topic>fault limit</topic></related><related type="narrower"><topic>indicating device</topic></related><related type="narrower"><topic>influence factor</topic></related><related type="narrower"><topic>initial intrinsic error</topic></related><related type="narrower"><topic>number of verification scale intervals</topic></related><related type="narrower"><topic>performance test</topic></related><related type="narrower"><topic>primary indication</topic></related><related type="narrower"><topic>scale interval</topic></related><related type="narrower"><topic>significant durability error</topic></related><related type="narrower"><topic>significant fault</topic></related><related type="narrower"><topic>terminal</topic></related><related type="narrower"><topic>test program</topic></related><related type="narrower"><topic>verification scale interval</topic></related><related type="broader"><topic>VIML</topic></related></mads>