<?xml version="1.0" encoding="utf-8"?><metadata xmlns:dc="http://purl.org/dc/elements/1.1/"  xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dcterms="http://purl.org/dc/terms/"><dc:title xml:lang="en-EN">pattern evaluation           #00260</dc:title><dc:identifier>https://digilab.ptb.de/oiml-g-18/vocab/skos/1358</dc:identifier><dc:language>en-EN</dc:language><dc:publisher xml:lang="en-EN">Julia Neumann</dc:publisher><dcterms:created>2022-12-19 09:13:36</dcterms:created><dcterms:isPartOf xsi:type="dcterms:URI">https://digilab.ptb.de/oiml-g-18/vocab/</dcterms:isPartOf><dcterms:isPartOf xml:lang="en-EN">OIML G18 Controlled Vocabulary</dcterms:isPartOf><dc:format>text/html</dc:format> <dc:description xml:lang="en-EN"><![CDATA[ Pattern evaluation is not limited to the National Service of Legal Metrology or the metrological services of other government agencies, but may also be undertaken by any other officially authorized test centre as well as by manufacturers and users of measuring instruments. The purpose of pattern evaluation is not necessarily pattern approval, its purpose may also be, for example, assessment of suitability for use. ]]> </dc:description></metadata>