<?xml version="1.0" encoding="utf-8"?><metadata xmlns:dc="http://purl.org/dc/elements/1.1/"  xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dcterms="http://purl.org/dc/terms/"><dc:title xml:lang="en-EN">electronic measuring instrument           #182</dc:title><dc:identifier>https://digilab.ptb.de/oiml-g-18/vocab/skos/582</dc:identifier><dc:language>en-EN</dc:language><dc:publisher xml:lang="en-EN">Julia Neumann</dc:publisher><dcterms:created>2022-12-19 09:13:31</dcterms:created><dcterms:isPartOf xsi:type="dcterms:URI">https://digilab.ptb.de/oiml-g-18/vocab/</dcterms:isPartOf><dcterms:isPartOf xml:lang="en-EN">OIML G18 Controlled Vocabulary</dcterms:isPartOf><dc:format>text/html</dc:format> <dc:description xml:lang="en-EN"><![CDATA[ 1. For the purpose of this Document, ancillary   0 equipment, as long as it is subject to legal metrological control, is considered to be part of the measuring instrument. 2. [OIML D 11:2004, 3.1] ]]> </dc:description></metadata>