{"tema_id":"656","string":"examination           #02160","created":"2022-12-19 09:13:31","code":null,"notes":[{"@type":"Scope note","@lang":"en-EN","@value":"(OIML B 3) "},{"@type":"Cataloger's note","@lang":"en-EN","@value":"reference: D030:2008 3 - G.3-1 "},{"@type":"Cataloger's note","@lang":"en-EN","@value":"ID: 02160 "},{"@type":"Definition note","@lang":"en-EN","@value":"visual inspection of an instrument or device and relevant documentation to ensure that some specified requirements are met "}]}