{"@context":{"dc":"http:\/\/purl.org\/dc\/elements\/1.1\/","skos":"http:\/\/www.w3.org\/2004\/02\/skos\/core#","skos:broader":{"@type":"@id"},"skos:inScheme":{"@type":"@id"},"skos:related":{"@type":"@id"},"skos:narrower":{"@type":"@id"},"skos:hasTopConcept":{"@type":"@id"},"skos:topConceptOf":{"@type":"@id"}},"@id":"https:\/\/digilab.ptb.de\/oiml-g-18\/vocab\/skos\/1765","@type":"skos:Concept","skos:prefLabel":{"@language":"en-EN","@value=":"significant fault (for associated measuring instruments other than CVDDs)           #02084"},"skos:inScheme":"https:\/\/digilab.ptb.de\/oiml-g-18\/vocab\/","dct:created":"2022-12-19 09:13:39","skos:scopeNote":[{"@lang":"en-EN","@value":"for associated measuring instruments other than CVDDs this concept applies to the whole associated measuring instrument, or to the electronic part only, according to what is subject to the test. "}],"skos:definition":[{"@lang":"en-EN","@value":"fault, the magnitude of which is greater than half of the magnitude of the maximum permissible error for the relevant measurand. However a fault, the magnitude of which is smaller than 2 scale intervals of the associated measuring instrument is never considered as a significant fault "}],"skos:broader":["https:\/\/digilab.ptb.de\/oiml-g-18\/vocab\/skos\/2"]}