<?xml version="1.0" encoding="utf-8"?><mads xmlns="http://www.loc.gov/mads/" xmlns:mods="http://www.loc.gov/mods/v3" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.loc.gov/mads/
	mads.xsd"><authority><topic authority="https://digilab.ptb.de/oiml-g-18/vocab/">conformity assessment of a measuring instrument           #00191</topic></authority><related type="broader"><topic>OIML</topic></related> <note xml:lang="en-EN">Conformity assessment does not only concern metrological requirements but may also cover requirements relating to: - safety; - EMC; - software identification; - ease of use; - marking; - etc. </note></mads>