<?xml version="1.0" encoding="utf-8"?><rdf:RDF  xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"  xmlns:rdfs="http://www.w3.org/2000/01/rdf-schema#"  xmlns:skos="http://www.w3.org/2004/02/skos/core#"  xmlns:map="http://www.w3c.rl.ac.uk/2003/11/21-skos-mapping#"  xmlns:dct="http://purl.org/dc/terms/"  xmlns:dc="http://purl.org/dc/elements/1.1/"><skos:ConceptScheme rdf:about="https://digilab.ptb.de/oiml-g-18/vocab/">  <dc:title>OIML G18 Controlled Vocabulary</dc:title>  <dc:creator>Julia Neumann</dc:creator>  <dc:contributor></dc:contributor>  <dc:publisher></dc:publisher>  <dc:rights></dc:rights>  <dc:subject></dc:subject>  <dc:description><![CDATA[  ]]></dc:description>  <dc:date>2022-12-16</dc:date>  <dct:modified>2023-01-02 10:32:57</dct:modified>  <dc:language>en-EN</dc:language>  </skos:ConceptScheme>  <skos:Concept rdf:about="https://digilab.ptb.de/oiml-g-18/vocab/skos/1358"><skos:prefLabel xml:lang="en-EN">pattern evaluation           #00260</skos:prefLabel> <skos:scopeNote xml:lang="en-EN">Pattern evaluation is not limited to the National Service of Legal Metrology or the metrological services of other government agencies, but may also be undertaken by any other officially authorized test centre as well as by manufacturers and users of measuring instruments. The purpose of pattern evaluation is not necessarily pattern approval, its purpose may also be, for example, assessment of suitability for use. </skos:scopeNote> <skos:definition xml:lang="en-EN">the examination of one or more measuring instruments of the same pattern which are submitted by a manufacturer to the National Service of Legal Metrology; this examination includes the tests necessary for the approval of the pattern [VML 2.2]. </skos:definition><skos:inScheme rdf:resource="https://digilab.ptb.de/oiml-g-18/vocab/"/><skos:broader rdf:resource="https://digilab.ptb.de/oiml-g-18/vocab/skos/2"/>  <dct:created>2022-12-19 09:13:36</dct:created>  </skos:Concept></rdf:RDF>