<?xml version="1.0" encoding="utf-8"?><rdf:RDF  xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"  xmlns:rdfs="http://www.w3.org/2000/01/rdf-schema#"  xmlns:skos="http://www.w3.org/2004/02/skos/core#"  xmlns:map="http://www.w3c.rl.ac.uk/2003/11/21-skos-mapping#"  xmlns:dct="http://purl.org/dc/terms/"  xmlns:dc="http://purl.org/dc/elements/1.1/"><skos:ConceptScheme rdf:about="https://digilab.ptb.de/oiml-g-18/vocab/">  <dc:title>OIML G18 Controlled Vocabulary</dc:title>  <dc:creator>Julia Neumann</dc:creator>  <dc:contributor></dc:contributor>  <dc:publisher></dc:publisher>  <dc:rights></dc:rights>  <dc:subject></dc:subject>  <dc:description><![CDATA[  ]]></dc:description>  <dc:date>2022-12-16</dc:date>  <dct:modified>2023-01-02 10:32:57</dct:modified>  <dc:language>en-EN</dc:language>  </skos:ConceptScheme>  <skos:Concept rdf:about="https://digilab.ptb.de/oiml-g-18/vocab/skos/1984"><skos:prefLabel xml:lang="en-EN">type evaluation           #01877</skos:prefLabel> <skos:scopeNote xml:lang="en-EN">The term “pattern” is used in legal metrology with the same meaning as “type”; below only the term “type” is used. [VIML, 2.5] </skos:scopeNote> <skos:definition xml:lang="en-EN">systematic examination and testing of the performance of one or more samples of an identified type of measuring instrument against documented requirements, the results of which are contained in the evaluation report, in order to determine whether the type may be approved </skos:definition><skos:inScheme rdf:resource="https://digilab.ptb.de/oiml-g-18/vocab/"/><skos:broader rdf:resource="https://digilab.ptb.de/oiml-g-18/vocab/skos/2"/>  <dct:created>2022-12-19 09:13:41</dct:created>  </skos:Concept></rdf:RDF>