http://digilab.ptb.de/vocab/http://digilab.ptb.de/vocab/skos/66316Construction and operation of measuring instruments http://digilab.ptb.de/vocab/skos/66316 VIML BT http://digilab.ptb.de/vocab/skos/66316 associated measuring instrument NT http://digilab.ptb.de/vocab/skos/66316 control instrument NT http://digilab.ptb.de/vocab/skos/66316 checking facility NT http://digilab.ptb.de/vocab/skos/66316 durability test NT http://digilab.ptb.de/vocab/skos/66316 ancillary device NT http://digilab.ptb.de/vocab/skos/66316 performance test NT http://digilab.ptb.de/vocab/skos/66316 primary indication NT http://digilab.ptb.de/vocab/skos/66316 test program NT http://digilab.ptb.de/vocab/skos/66316 indicating device NT http://digilab.ptb.de/vocab/skos/66316 disturbance NT http://digilab.ptb.de/vocab/skos/66316 number of verification scale intervals NT http://digilab.ptb.de/vocab/skos/66316 influence factor NT http://digilab.ptb.de/vocab/skos/66316 verification scale interval NT http://digilab.ptb.de/vocab/skos/66316 significant durability error NT http://digilab.ptb.de/vocab/skos/66316 scale interval NT http://digilab.ptb.de/vocab/skos/66316 durability error NT http://digilab.ptb.de/vocab/skos/66316 durability NT http://digilab.ptb.de/vocab/skos/66316 significant fault NT http://digilab.ptb.de/vocab/skos/66316 fault limit NT http://digilab.ptb.de/vocab/skos/66316 fault NT http://digilab.ptb.de/vocab/skos/66316 initial intrinsic error NT http://digilab.ptb.de/vocab/skos/66316 terminal NT